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| ĒĖ | pęŧ | ú{ęŧ |
| AES | Auger Electron Spectroscopy | ĩ°ŧŪĒdqĒõ@ |
| AFM | Atomic Force Microscopy | ´qÔÍ°÷ž |
| EPMA | Electron Probe Micro-Analysis | XüĪ˛¸ÛąÅײģŪ |
| ESCA | Electron Spectroscopy for Chemical Analysis | XüõdqĒõ@ |
| EXAFS | Extended X-ray Absorption Fine Structure | XüzûLæAą÷×\ĸ |
| FTIR | Fourier Transform Infra Red | Ė°Ø´ÔOĒõĒÍ |
| HREELS | High Resolution Electron Energy Loss Spectroscopy | dq´ČŲˇŪ°š¸Ēõ@ |
| IMA | Ion Microprobe Analysis | ˛ĩŨĪ˛¸ÛąÅØŧŊ |
| IRAS |
Infra-Red Absorbtion Spectroscopy | ÔOŊËĒõ@ |
| ISS | Ion Scattering Spectroscopy | ˛ĩŨUĒõ@ |
| LEED | Low Energy Electron Diffraction | áŦdqņÜ@ |
| NEXAFS | Near-Edge X-ray Absorption Fine Structure | Xüzû[ßT÷×\ĸ |
| NMR | Nuclear Magnetic Resonance | jĨC¤Â@ |
| PIXE | Particle Induced X-ray Emission | ąqãNXüĒõ@ |
| Raman | Raman Spectroscopy | ×ĪŨĒõ@ |
| RBS | Rutherford Back Scattering | ×ģŪĖĢ°ÄŪãûU@ |
| RHEED | Reflection High Energy Electron Diffraction | ŊËŦdqüņÜ |
| SAM | Scanning Auger Microscopy | ¸^ĩ°ŧŪĒdqĒõ@ |
| SEM | Secondary Electron Microscopy | ¸^dq°÷ž |
| SIMS | Secondary Ion Mass Spectrometry | Q˛ĩŨŋĘĒÍ@ |
| STM | Scanning Tunnelling Microscopy | ¸^ÄŨČŲ°÷ž |
| SXRD | Surface X-ray Diffraction | \ĘXüņÜ@ |
| TDS | Thermal Desorption Spectroscopy | ¸ˇEŖ@ |
| UPS | Ultraviolet Photoemission Spectroscopy | OõdqĒõ@ |
| XANES | X-ray Absorption Near-Edge Structure | Xüzû[ßT÷×\ĸ |
| XPS | X-ray Photoemission Spectroscopy | XüõdqĒõ@ |
| XRR | X-ray Diffraction | XüņÜ@ |
| XRF | X-ray Fuluorescence spectroscopy | uõXüĒÍ@ |